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Updated: Aug 17, 2025

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
Published on: September 22, 2017
Yao Hu1, Zhen Wang1, Qun Hao1,2
1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.
This study introduces a novel polarization grating interferometer for testing small F/# concave surfaces. This system simplifies subaperture scanning, reducing errors and enabling direct full-aperture figure error measurement.
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