Ferromagnetism
Biasing of Metal-Semiconductor Junctions
Metal-Semiconductor Junctions
Dielectric Polarization in a Capacitor
Biasing of P-N Junction
P-N junction
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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Bilu Liu1, Hui-Ming Cheng2,3
1Shenzhen Geim Graphene Center, Tsinghua-Berkeley Shenzhen Institute & Institute of Materials Research, Shenzhen International Graduate School, Tsinghua University, Shenzhen, China. bilu.liu@sz.tsinghua.edu.cn.
No abstract available in PubMed .