Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Emission Spectroscopy: Overview

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

SiC resistive X-ray beam monitor for intensity and position control of synchrotron light.

Journal of synchrotron radiation·2026

Same author

Antifluorite-derived Li<sub>7</sub>MnN<sub>4</sub>: revisiting the crystal structure and catalysis in ammonia decomposition.

Catalysis science & technology·2026

Same author

Operando X-ray Raman Ni 2p spectra of LiNi<sub>x</sub>Mn<sub>y</sub>Co1-x-yO<sub>2</sub> lithium-ion battery electrodes.

MRS advances·2026

Same author

Invited Article: High-quality blazed gratings through synergy between e-beam lithography and robust characterization techniques.

The Review of scientific instruments·2025

Same author

Tailored photoactivity of 2D nanosheets synthesized by electron irradiation of metal-organic Ru(II) monolayers.

Nanoscale·2025

Same author

Tender x-ray microfocus beamline employing a combined double crystal/multilayer grating monochromator.

The Review of scientific instruments·2025

Same journal

Anion-Engineered Organic Electrochemical Transistors With Multi-Timescale Synaptic Dynamics for Task-Adaptive Spiking Neural Networks.

Small (Weinheim an der Bergstrasse, Germany)·2026

Same journal

Dimensional Effect on the Lattice Anharmonicity in Graphene and Graphite.

Small (Weinheim an der Bergstrasse, Germany)·2026

Same journal

A Modular Core-Shell Nanoparticle Platform for Dual-Modal MRI-Luminescence With High Relaxivity.

Small (Weinheim an der Bergstrasse, Germany)·2026

Same journal

Highly Selective Construction of D<sub>2</sub>-Symmetric Chiral Carbon Nanorings and the Diverse Assembly With Fullerenes.

Small (Weinheim an der Bergstrasse, Germany)·2026

Same journal

A Synergistic Process Optimization and Data-Driven Modeling Strategy for Unraveling and Enhancing the Low-Light Response in Back-Contact Solar Cells.

Small (Weinheim an der Bergstrasse, Germany)·2026

Same journal

Porous Hydrogel-Mediated One-Step Selection of Mannoprotein-Targeted Aptamers for Early Diagnosis of Invasive Saccharomyces cerevisiae Infections.

Small (Weinheim an der Bergstrasse, Germany)·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Aug 17, 2025

In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis

In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis

Published on: February 3, 2018

Quantitative Element-Sensitive Analysis of Individual Nanoobjects.

André Wählisch¹, Rainer Unterumsberger¹, Philipp Hönicke¹

¹Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587, Berlin, Germany.

Small (Weinheim an Der Bergstrasse, Germany)

|December 15, 2022

Summary

This summary is machine-generated.

Traceable quantification of individual nanoobjects is possible using X-ray fluorescence microscopy with well-calibrated instruments. This method avoids the need for reference nanomaterials, enabling accurate analysis of advanced materials.

Keywords:

nanobeam X-ray fluorescence (XRF)nanometrology nanostructure characterization quantitative analysis

More Related Videos

Laser-induced Breakdown Spectroscopy: A New Approach for Nanoparticle's Mapping and Quantification in Organ Tissue

Laser-induced Breakdown Spectroscopy: A New Approach for Nanoparticle's Mapping and Quantification in Organ Tissue

Published on: June 18, 2014

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Related Experiment Videos

Last Updated: Aug 17, 2025

In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis

In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis

Published on: February 3, 2018

Laser-induced Breakdown Spectroscopy: A New Approach for Nanoparticle's Mapping and Quantification in Organ Tissue

Laser-induced Breakdown Spectroscopy: A New Approach for Nanoparticle's Mapping and Quantification in Organ Tissue

Published on: June 18, 2014

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

Materials Science
Nanotechnology
Analytical Chemistry

Background:

Quantitative material analysis is vital for new technologies, particularly at the nanoscale.
X-ray fluorescence microscopy (XFM) is an element-sensitive, non-destructive technique for nanomaterials.
Current XFM quantification is often limited to qualitative or semi-quantitative analysis at the nanoscale.

Purpose of the Study:

To demonstrate traceable quantification of individual nanoobjects using XFM.
To overcome limitations of reference nanomaterial dependency in nanoscale analysis.
To establish a method for accurate atom counting in nanoobjects.

Main Methods:

Utilized a well-calibrated X-ray fluorescence microscope.
Employed soft X-ray radiation for analysis.
Reconstructed complementary dimensional parameters of nanoobjects.

Main Results:

Achieved traceable quantification of the total number of atoms in a germanium nanoobject.
Demonstrated the feasibility of quantitative analysis without reference nanomaterials.
Successfully reconstructed dimensional parameters of the analyzed nanoobjects.

Conclusions:

Traceable quantification of individual nanoobjects is achievable with conventional, well-calibrated XFM instrumentation.
This approach provides a reliable alternative to reference materials for nanoscale analysis.
Enables accurate assessment of advanced nanotechnological materials.