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Updated: Aug 16, 2025

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Magnetic field modulated dynamics of partial discharges in defects of high voltage insulating materials

Marek Florkowski1

  • 1AGH University of Science and Technology, Al. Mickiewicza 30, 30-059, Kraków, Poland. marek.florkowski@agh.edu.pl.

Scientific Reports
|December 21, 2022
PubMed

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