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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Electrical spectroscopy of defect states and their hybridization in monolayer MoS2

Yanfei Zhao1,2, Mukesh Tripathi1,2, Kristiāns Čerņevičs3

  • 1Institute of Electrical and Microengineering, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Lausanne, Switzerland.

Nature Communications
|January 3, 2023
PubMed

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