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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Metal-insulator transition at low densities in a two-dimensional low-bandgap semiconductor
Ali Al Mejamai1, Thiti Taychatanapat2, Johan Félisaz3
1Department of Materials Science and Engineering, National University of Singapore, Singapore, 117575, Singapore.
None:
Metal-insulator transitions in low band-gap systems emerge from the interplay of interactions, disorder, and band structure on comparable energy scales. Platinum diselenide, with its thickness-dependent electronic structure, provides an ideal platform to explore this regime, as the five-layer limit lies close to the semimetallic boundary while retaining a small bandgap (~0.1 eV). Here we show that hexagonal boron nitride-encapsulated five-layer PtSe2 devices with embedded ultra-flat, pre-patterned platinum contacts exhibit high electronic quality, with mobilities up to 1,640 cm2V-1s-1 and contact resistances as low as 1.31 kΩ·μm at 1.5 K. These characteristics enable a gate-tunable metal-insulator transition at carrier densities down to 2.75 × 10¹⁰ cm⁻². Transport in this regime is dominated by electron-electron interactions, as supported by finite-temperature scaling. Below 50 K, however, an additional disorder-related energy scale emerges, consistent with percolation. These results demonstrate that disorder remains relevant even in high-mobility devices, challenging a purely interaction-driven transition in two-dimensional systems.
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