In situ cryo-FIB/SEM Specimen Preparation Using the Waffle Method

Oleg Klykov1, Daija Bobe1, Mohammadreza Paraan1

  • 1National Center for In-situ Tomographic Ultramicroscopy, Simons Electron Microscopy Center, New York Structural Biology Center, New York, NY, USA.

Bio-Protocol
|January 9, 2023
PubMed
Summary

The Waffle Method protocol enables efficient cryo-focused ion beam (FIB) milling of thick vitrified specimens. This technique improves throughput for cryo-electron tomography (cryo-ET) sample preparation, yielding high-quality cryo-lamellae.