SiO-induced thermal instability and interplay between graphite and SiO in graphite/SiO composite anode
Ban Seok Lee1, Sang-Hwan Oh1, Yoon Jeong Choi1
1Department of Chemical and Biological Engineering, Korea University, Seoul, 02841, Republic of Korea.
Nature Communications
|January 11, 2023
Summary
Silicon monoxide (SiO) in lithium-ion batteries (LIBs) causes thermal instability, accelerating lithium loss and self-discharge in graphite anodes. Understanding this interaction is key to improving LIB shelf life.
Area of Science:
- Materials Science
- Electrochemistry
- Energy Storage
Background:
- Silicon monoxide (SiO) offers higher capacity than graphite for lithium-ion batteries (LIBs).
- Incorporating SiO into graphite anodes degrades LIB cycle and calendar life, with aging mechanisms poorly understood.
- Thermal instability of graphite/SiO composite anodes is a critical issue for LIB performance.
Purpose of the Study:
- Investigate the SiO-induced thermal instability in graphite/SiO composite anodes.
- Elucidate the aging mechanisms responsible for LIB degradation.
- Identify strategies to enhance the shelf life of SiO-containing LIBs.
Main Methods:
- Thermal exposure experiments on graphite/SiO composite anodes.
- Analysis of lithium inventory loss and de-intercalation from graphite.
- Investigation of parasitic reactions at the SiO interface.
- Study of electron and lithium-ion migration dynamics.
Main Results:
- SiO accelerates lithium inventory loss under thermal stress.
- SiO facilitates lithium de-intercalation from graphite, causing self-discharge.
- Preferential parasitic reactions on the SiO interface drive this phenomenon.
- Spontaneous electron and ion migration equilibrates energy imbalance between graphite and SiO.
Conclusions:
- The electron-level interplay between graphite and SiO is crucial for understanding LIB aging.
- SiO's thermal instability contributes significantly to self-discharge in composite anodes.
- Addressing these interfacial reactions is vital for improving the shelf life and performance of next-generation LIBs.


