Scanning Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Overview of Electron Microscopy
Two-Dimensional Microscopy in Microbiology
Overview of Microscopy Techniques
Transmission Electron Microscopy
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Updated: Aug 14, 2025

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
Published on: June 23, 2023
Enea Prifti1, James P Buban1, Arashdeep Singh Thind1
1Department of Physics, University of Illinois Chicago, 845 W Taylor Street, Chicago, IL, 60607, USA.
A new Convolutional Variational Autoencoder (CVAE) method automatically detects structural anomalies in atomic-resolution scanning transmission electron microscopy (STEM) images. This machine learning approach distinguishes point defects from perfect crystal structures, enabling faster material analysis.
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