MOS Capacitor
Field Effect Transistor
Biasing of FET
Types of Semiconductors
Biasing of Metal-Semiconductor Junctions
MOSFET
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Updated: Aug 14, 2025

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Junjun Wang1, Feng Wang1, Zhenxing Wang1
1CAS Center for Excellence in Nanoscience, CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing 100190, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
Ferroelectric semiconductor materials enable single transistors to perform complex logic and in-memory computing. This integration offers higher performance and novel architectures for microelectronics.
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