Cinematic reflectometry using QIKR, the quite intense kinetics reflectometer

J F Ankner1, R Ashkar2, J F Browning3

  • 1Second Target Station Project, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.

Summary

The new Quite Intense Kinetics Reflectometer (QIKR) enables real-time neutron reflectivity measurements for dynamic materials science. This advanced technique allows for rapid, in-situ observation of processes like polymer diffusion and battery cycling.

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