Related Experiment Video
Updated: Aug 10, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Two-dimensional scanning of silicon-based focal plane array with field-of-view splicing technology
Abstract:
All-solid-state beam scanning chip is ideal for next-generation LiDAR due to its reliability and small size. Here we propose a focal plane array chip for two-dimensional scanning using field-of-view splicing technology on silicon photonics platform. The chip has two rotationally symmetric structures, each including a 1 × 64 antenna array accompanied by a 1 × 64 micro-ring optical switch array. We demonstrate a two-dimensional scanning equivalent to an 8-line LiDAR with a field-of-view of 82° × 32°, a beam divergence angle of 0.07° × 0.07°, and a background suppression ratio of over 20 dB. Our chip works in such a simple way that only one optical switch needs to be turned on each time the beam is emitted. And the chip is scalable that a larger range of two-dimensional scanning can be achieved when using more antennas for field-of-view splicing and cascading more optical switches.

