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Real-time tilt undersampling optimization during electron tomography of beam sensitive samples using golden ratio
Timothy M Craig1, Ajinkya A Kadu1,2, Kees Joost Batenburg2,3
1Electron Microscopy for Materials Science and NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp 2020, Belgium. sara.bals@uantwerpen.be.
Nanoscale
|February 24, 2023
Summary
Electron tomography for nanomaterials can damage samples. This study introduces a new protocol using golden ratio scanning and quasi-3D reconstruction to find the optimal number of projections in real-time, minimizing damage and artifacts.
Area of Science:
- Materials Science
- Microscopy
- Nanotechnology
Background:
- Electron tomography is crucial for 3D nanomaterial analysis but risks sample damage from high electron doses and prolonged exposure.
- Reducing projections (tilt undersampling) minimizes beam damage but can cause reconstruction artifacts due to insufficient data.
- Accurate 3D reconstructions of beam-sensitive samples require balancing electron dose and sampling for optimal projection numbers.
Purpose of the Study:
- To develop a real-time protocol for determining the optimal number of projections in electron tomography.
- To minimize beam exposure and reconstruction artifacts for beam-sensitive samples.
- To improve the efficiency of 3D structural analysis in electron microscopy.
Main Methods:
- Proposed a novel protocol combining golden ratio scanning and quasi-3D reconstruction.
- Developed a real-time estimation method for optimal projection count during a single acquisition.
- Validated the protocol using simulated and real nanoparticle samples.
Main Results:
- Successfully estimated the optimal number of projections in real-time.
- Demonstrated reduced sample damage and minimized reconstruction artifacts.
- Applied the protocol to successfully reconstruct two beam-sensitive metal-organic framework complexes.
Conclusions:
- The proposed protocol offers an efficient and effective method for optimizing electron tomography acquisition for beam-sensitive nanomaterials.
- This approach reduces the need for multiple samples and extensive post-processing, saving time and resources.
- Enables more accurate and reliable 3D structural analysis of delicate nanoscale materials.

