Related Experiment Video
Updated: Aug 8, 2025

09:33
Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces
Published on: June 7, 2019
6.3K
Perovskite Microlaser Integration with Metasurface Supporting Topological Waveguiding
Alexander Berestennikov1,2, Svetlana Kiriushechkina1, Anton Vakulenko1
1Department of Electrical Engineering, Grove School of Engineering, City College of the City University of New York, New York 10031, United States.
ACS Nano
|February 27, 2023
Summary
Robust halide perovskite microlasers integrated with topological metasurfaces enable defect-tolerant light delivery for reconfigurable optical chips. This breakthrough enhances the resilience of photonic devices against structural imperfections.
Area of Science:
- Photonics and Materials Science
- Optoelectronics and Nanotechnology
Background:
- Halide perovskite microlasers offer robust emission, suitable for sensing and optical chips.
- Their
- defect tolerance
- simplifies synthesis and integration into photonic designs.
Purpose of the Study:
- To demonstrate the integration of defect-tolerant halide perovskite microlasers with topological metasurfaces.
- To achieve robust outcoupling and delivery of coherent light over significant distances despite structural imperfections.
Main Methods:
- Fabrication of halide perovskite microlasers and topological metasurfaces.
- Integration of microlasers onto metasurfaces supporting topological guided boundary modes.
- Characterization of light propagation and outcoupling efficiency in the presence of structural defects.
Main Results:
- Successful combination of perovskite microlasers with topological metasurfaces.
- Demonstration of robust coherent light delivery over tens of microns, overcoming waveguide corners, random microlaser placement, and mechanical defects.
- Evidence of resilience to various structural imperfections in the integrated system.
Conclusions:
- The developed platform offers a strategy for robust integrated lasing-waveguiding designs.
- This approach enhances the resilience of photonic devices to a broad range of structural imperfections for both electrons and photons.
- Enables advanced reconfigurable optical chips and sensing applications.

