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Updated: Aug 8, 2025

Characterizing Bacterial Volatiles using Secondary Electrospray Ionization Mass Spectrometry SESI-MS
Published on: June 8, 2011
A diagnostic for quantifying secondary species emission from electrospray devices
N M Uchizono1, R E Wirz1, A L Collins1
1Plasma and Space Propulsion Laboratory, Department of Mechanical and Aerospace Engineering, University of California, Los Angeles, 420 Westwood Plaza, Los Angeles, California 90095, USA.
This study introduces a new probe to accurately measure electrospray current by distinguishing primary species from secondary species emission (SSE). This method reduces measurement uncertainty for charged particle beams.
Area of Science:
- Physics
- Analytical Chemistry
- Materials Science
Background:
- Electrospray devices produce charged species beams critical for various applications.
- Accurate current measurement is essential for understanding electrospray performance.
- Secondary species emission (SSE) introduces significant uncertainty in current measurements.
Purpose of the Study:
- To develop and validate a novel probe and analysis method for distinguishing primary species current from positive and negative secondary species emission (SSE).
- To mitigate measurement uncertainty in charged species beam characterization.
- To obtain accurate SSE yield measurements and corrected primary current values.
Main Methods:
- A specialized probe design to differentiate current contributions from primary species and SSE.
- Analysis techniques to separate positive SSE, negative SSE, and primary species currents.
- Experimental validation using an ionic liquid electrospray in droplet emission mode.
Main Results:
- The developed method successfully distinguishes current contributions from primary species and both positive and negative SSE.
- Quantified angular distributions of positive and negative SSE yields for an ionic liquid electrospray.
- Provided corrected primary current measurements, reflecting true primary beam characteristics.
Conclusions:
- The probe and analysis techniques effectively reduce uncertainty in electrospray current measurements.
- Accurate SSE yield data can be obtained, crucial for optimizing electrospray performance.
- This method offers a pathway to more reliable characterization of charged particle beams.
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