Speckle Measurement for Small In-Plane Vibration Using GaAs

In this study, the measurement characteristics of speckles based on the photoinduced electromotive force (photo-emf) effect for high-frequency, small-amplitude, and in-plane vibration were theoretically and experimentally studied. The relevant theoretical models were utilized. A GaAs crystal was used as the photo-emf detector for experimental research, as well as to study the influence of the amplitude and frequency of the vibration, the imaging magnification of the measuring system, and the average speckle size of the measuring light on the first harmonic of the induced photocurrent in the experiments. The correctness of the supplemented theoretical model was verified, and a theoretical and experimental basis was provided for the feasibility of using GaAs to measure in-plane vibrations with nanoscale amplitudes.