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Published on: January 16, 2020
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Method to improve critical current density measurement of superconducting materials
Yunkai Shao1, Longxiang Liu1, Sansheng Wang1
1School of Physics, Beihang University, Beijing 102206, China.
Methodsx
|March 20, 2023
Summary
A novel double-sided measurement method enhances the third harmonic voltage technique for high-temperature superconducting films. This approach significantly improves signal-to-noise ratio for critical current density measurements.
Area of Science:
- Superconductivity
- Materials Science
- Electrical Engineering
Background:
- Critical current density (Jc) is crucial for superconducting material applications.
- The third harmonic voltage method offers a non-destructive way to measure Jc in high-temperature superconducting films.
- Existing methods face challenges in signal-to-noise ratio for REBa2Cu3O7-δ films.
Purpose of the Study:
- To propose and validate a double-sided measurement method for improving Jc measurements.
- To enhance the signal-to-noise ratio in third harmonic voltage measurements of superconducting films.
- To adapt the technique for REBa2Cu3O7-δ films and high critical current densities.
Main Methods:
- A double-sided measurement system integrating electromagnetic shielding and a 2-coil setup was developed.
- The Meissner effect was utilized to minimize harmonic voltage noise in the pickup coil.
- Performance was compared against a standard 2-coil system in the 100 Hz to 1000 Hz range.
Main Results:
- The double-sided method demonstrated a 10-20 dB increase in signal-to-noise ratio compared to the 2-coil system.
- Noise reduction in the pickup coil was achieved using the Meissner effect within the specified frequency range.
- The measurement bandwidth was expanded, enabling potential future low-frequency measurements.
Conclusions:
- The proposed double-sided measurement method significantly improves Jc measurement accuracy for superconducting films.
- This technique offers a pathway for developing advanced measurement systems for materials with high critical current densities.
- The method provides a foundation for future research into low-frequency measurements and enhanced superconducting film characterization.
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