Angle-dependent spectral reflectance material dataset based on 945 nm time-of-flight camera measurements

The main objective of this article is to provide angle-dependent spectral reflectance measurements of various materials in the near infrared spectrum. In contrast to already existing reflectance libraries, e.g., NASA ECOSTRESS and Aster reflectance libraries, which consider only perpendicular reflectance measurements, the presented dataset includes angular resolution of the material reflectance. To conduct the angle-dependent spectral reflectance material measurements, a new measurement device based on a 945 nm time-of-flight camera is used, which was calibrated using Lambertian targets with defined reflectance values at 10, 50, and 95%. The spectral reflectance material measurements are taken for an angle range of 0° to 80° with 10° incremental steps and stored in table format. The developed dataset is categorized with a novel material classification, divided into four different levels of detail considering material properties and distinguishing predominantly between mutually exclusive material classes (level 1) and material types (level 2). The dataset is published open access on the open repository Zenodo with record number 7467552 and version 1.0.1 [1]. Currently, the dataset contains 283 measurements and is continuously extended in new versions on Zenodo.