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Low Threshold Current and Polarization-Stabilized 795 nm Vertical-Cavity Surface-Emitting Lasers
Qiuxue Fu1, Yurun Sun2, Suzhen Yu2
1School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, Hefei 230026, China.
Nanomaterials (Basel, Switzerland)
|March 29, 2023
Summary
Researchers developed novel polarization-stabilized 795 nm vertical-cavity surface-emitting lasers (VCSELs) with a low threshold current. These VCSELs utilize an integrated surface grating for enhanced performance and stability.
Area of Science:
- Optoelectronics
- Semiconductor Devices
- Photonics
Background:
- Vertical-cavity surface-emitting lasers (VCSELs) are crucial optoelectronic components.
- Achieving stable polarization and low threshold current in VCSELs remains a key challenge.
- Surface gratings offer a potential solution for enhancing VCSEL performance.
Purpose of the Study:
- To fabricate and characterize low threshold current, polarization-stabilized 795 nm VCSELs.
- To investigate the effectiveness of integrated surface gratings for polarization control.
- To analyze the impact of grating parameters on VCSEL performance.
Main Methods:
- Design of a high polarization selectivity and high reflectivity surface grating using rigorous coupled-wave analysis.
- Fabrication of VCSELs incorporating the designed surface grating.
- Experimental characterization of threshold current, polarization suppression ratio, emission wavelength, and temperature dependence.
Main Results:
- Achieved a low threshold current of 0.4 mA.
- Obtained a high orthogonal polarization suppression ratio (OPSR) of 19.56 dB.
- Demonstrated stable 795 nm single transverse mode emission at 85 °C with 0.9 mA injection current.
- Identified dependence of threshold current and output power on the grating region size.
Conclusions:
- The integrated surface grating effectively stabilizes polarization and reduces threshold current in 795 nm VCSELs.
- Rigorous coupled-wave analysis is a suitable method for designing high-performance gratings.
- Grating dimensions significantly influence VCSEL operational characteristics, offering a means for device optimization.
