Determination of Magnetic Structures in Magnetic Microwires with Longitudinally Distributed Magnetic Anisotropy

We studied the magnetic properties of a glass-covered amorphous microwire that was stress-annealed at temperatures distributed along the microwire length. The Sixtus-Tonks, Kerr effect microscopy and magnetic impedance techniques have been applied. There was a transformation of the magnetic structure across the zones subjected to annealing at different temperatures. The annealing temperature distribution induces the graded magnetic anisotropy in the studied sample. The variety of the surface domain structures depending on the longitudinal location has been discovered. Spiral, circular, curved, elliptic and longitudinal domain structures coexist and replace each other in the process of magnetization reversal. The analysis of the obtained results was carried out based on the calculations of the magnetic structure, assuming the distribution of internal stresses.