Related Experiment Video
Updated: Aug 4, 2025

Advanced Compositional Analysis of Nanoparticle-polymer Composites Using Direct Fluorescence Imaging
Published on: July 19, 2016
Data analysis for the characterization of nanoparticles with single particle inductively coupled plasma mass
Jinhui Liu1, Xing Wei1, Chengxin Wu1
1Research Center for Analytical Sciences, Department of Chemistry, College of Sciences, Northeastern University, Box 332, Shenyang, 110819, China.
Abstract:
Single particle-inductively coupled plasma-mass spectrometry (SP-ICP-MS) has become a powerful technique for the characterization of nanoparticles (NPs). However, the accuracy of the characterization of NPs by SP-ICP-MS is greatly affected by the data acquisition rate and the way of data processing. For SP-ICP-MS analysis, ICP-MS instruments typically apply microsecond to millisecond dwell times (10 μs-10 ms). Considering the duration of one nanoparticle event in the detector is 0.4-0.9 ms, NPs will show different data forms when working with microsecond and millisecond dwell times. In this work, the effects of dwell times from microsecond to millisecond (50 μs, 100 μs, 1 ms and 5 ms) on the data forms in SP-ICP-MS analysis are discussed. The data analysis and data processing for different dwell times is discussed in detail, including the measurement of transport efficiency (TE), the distinction of signal and background, the evaluation of diameter limit of detection (LODd) and the quantification of mass, size and particle number concentration (PNC) of NPs. This work provides data support for the data processing process and aspects to be considered in the characterization of NPs by SP-ICP-MS, which is expected to provide guidance and reference for researchers in SP-ICP-MS analysis.
More Related Videos
14:53In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis
Published on: February 3, 2018
11:18A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer SMPS-ICPMS
Published on: July 11, 2017
Related Concept Videos
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences