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Published on: April 3, 2018
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Extreme ultraviolet metalens by vacuum guiding
Marcus Ossiander1, Maryna Leonidivna Meretska1, Hana Kristin Hampel2
1John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA.
Summary
Metasurfaces offer a superior method for focusing extreme ultraviolet (EUV) light by precisely controlling light transmission at the nanoscale. This breakthrough enables advanced applications in material science and lithography.
Area of Science:
- Optics and Photonics
- Material Science
- Nanotechnology
Background:
- Extreme ultraviolet (EUV) radiation is crucial for advanced material science, attosecond metrology, and lithography.
- Existing transmissive optics for EUV light are limited by material properties.
- Metasurfaces offer a novel approach to manipulate light at the nanoscale.
Purpose of the Study:
- To experimentally demonstrate metasurfaces as a superior focusing method for EUV light.
- To leverage the unique optical properties of silicon membrane holes for light guidance.
- To introduce dielectric metasurface capabilities to the EUV spectral regime.
Main Methods:
- Fabrication of an EUV metalens using silicon membranes with precisely controlled hole diameters.
- Utilizing the difference in refractive index between silicon holes and the surrounding material for vacuum-guiding light.
- Focusing ultrashort EUV light bursts generated by high-harmonic generation.
Main Results:
- Demonstrated metasurfaces as an effective method for focusing EUV light.
- Achieved nanoscale control over light transmission phase via hole diameter.
- Fabricated a 10-mm focal length metalens with numerical apertures up to 0.05.
- Focused EUV light to a 0.7-micrometer waist.
Conclusions:
- Metasurfaces provide a powerful new tool for manipulating EUV light, overcoming limitations of traditional optics.
- This technology opens up new possibilities for light-shaping in the EUV spectrum.
- The demonstrated metalens design is suitable for applications requiring precise EUV focusing.
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