Dynamic evolution mechanism of scanning moiré fringes

Scanning moiré fringes (SMFs) in scanning transmission electron microscopy (STEM) have a broad application prospect owing to the low-magnification imaging and hereto the low electron irritation damage, especially in defects localization, strain analysis etc. However, the dynamic evolution mechanism of SMFs is still not clear. In this paper, we carry out in-depth study of SMFs with ferroelectric material GeSe as an example. With the help of combination of aberration-corrected STEM imaging and geometrical model, we discuss the evolution of SMFs with variation of scanning step (magnification), and explain its quasiperiodic behavior in the experiments. Our results will deepen the understanding of SMFs, and may widen their applications under the guidance of the new formation mechanism.