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Segmentation of Unsound Wheat Kernels Based on Improved Mask RCNN
Ran Shen1,2, Tong Zhen1,2, Zhihui Li1,2
1College of Information Science and Engineering, Henan University of Technology, Zhengzhou 450001, China.
Sensors (Basel, Switzerland)
|April 13, 2023
Summary
This study introduces an improved Mask R-CNN algorithm for accurately and efficiently detecting unsound wheat kernels. The new method enhances wheat quality grading by overcoming limitations of manual inspection and traditional image processing.
Area of Science:
- Agricultural Science
- Computer Vision
- Machine Learning
Background:
- Wheat quality grading relies on identifying unsound kernels, a process currently inefficient due to manual sorting.
- Traditional image processing methods struggle with separating clumped or adherent wheat kernels.
- Accurate and rapid detection of unsound kernels is crucial for effective wheat quality evaluation.
Purpose of the Study:
- To develop a novel algorithm for rapid and accurate recognition of unsound wheat kernels.
- To address the challenges of manual inspection and limitations of traditional image processing in kernel separation.
- To improve the efficiency and precision of wheat grading systems.
Main Methods:
- An improved Mask R-CNN model was proposed, incorporating a bottom-up pyramid network to enhance low-level feature information.
- An attention mechanism (AM) module was integrated to boost detection accuracy for small or occluded targets.
- The regional proposal network (RPN) was optimized to refine prediction performance for unsound kernel identification.
Main Results:
- The improved Mask R-CNN algorithm demonstrated faster and more accurate identification of unsound wheat kernels.
- The model effectively handled issues with adherent kernels, improving segmentation capabilities.
- Achieved a precision of 86% and a recall of 91%, with an inference time of 7.83 seconds for images with approximately 200 targets.
Conclusions:
- The developed algorithm significantly improves the speed and accuracy of unsound wheat kernel detection compared to existing methods.
- This approach offers a robust solution for automated wheat grading, addressing key limitations in current practices.
- The findings lay a strong foundation for advancing automated quality assessment in the grain industry.

