Segmentation of Unsound Wheat Kernels Based on Improved Mask RCNN

Ran Shen1,2, Tong Zhen1,2, Zhihui Li1,2

  • 1College of Information Science and Engineering, Henan University of Technology, Zhengzhou 450001, China.

Summary

This study introduces an improved Mask R-CNN algorithm for accurately and efficiently detecting unsound wheat kernels. The new method enhances wheat quality grading by overcoming limitations of manual inspection and traditional image processing.

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