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Updated: Aug 2, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Lili Shi1, Sijin Wu1, Miao Yan1,2
1School of Instrumentation Science and Opto-Electronics Engineering, Beijing Information Science and Technology University, Beijing 100192, China.
This study introduces a novel targetless method using digital speckle pattern interferometry (DSPI) to measure three-degree-of-freedom (3-DOF) angular motion errors in precision equipment. The system achieves submicron arc level resolution for pitch, yaw, and roll angles simultaneously.
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