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A Study on ML-Based Software Defect Detection for Security Traceability in Smart Healthcare Applications.

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  • 1Department of Computer Science, Kristianstad University, SE-29188 Kristianstad, Sweden.

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Summary
This summary is machine-generated.

This study investigates machine learning techniques for Software Defect Prediction (SDP). Partial Least Squares Regression (PLS) combined with feature selection methods significantly improves defect prediction accuracy.

Keywords:
ensemble learningfeature extractionfeature selectionmachine learningsoftware defects predictionsoftware development life-cycle

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Area of Science:

  • Computer Science
  • Software Engineering

Background:

  • Software systems are increasingly complex, raising defect risks.
  • Accurate Machine Learning (ML) models for Software Defect Prediction (SDP) are crucial but underexplored.
  • This research addresses the need for effective ML techniques in SDP.

Purpose of the Study:

  • To investigate and compare various ML techniques for SDP.
  • To analyze the impact of Feature Extraction (FE) and Feature Selection (FS) on SDP performance.
  • To recommend optimal FE, FS, and ML combinations for accurate defect prediction.

Main Methods:

  • Evaluated Feature Extraction (FE) techniques like Principal Component Analysis (PCA) and Partial Least Squares Regression (PLS).
  • Assessed Feature Selection (FS) methods including Fisher score, Recursive Feature Elimination (RFE), and Elastic Net.
  • Validated ML algorithms (SVM, LR, NB, KNN, MLP, DT) and ensemble methods (Bagging, AdaBoost, XGBoost, RF, Stacking) with FE/FS techniques.

Main Results:

  • Feature Extraction and Feature Selection can impact SDP model performance positively or negatively.
  • Partial Least Squares Regression (PLS), especially with FS techniques, consistently yielded the most significant improvements.
  • Principal Component Analysis (PCA) combined with Elastic-Net showed acceptable performance gains.

Conclusions:

  • Feature engineering (FE and FS) is vital for enhancing Software Defect Prediction models.
  • PLS-based approaches offer robust and reliable improvements for SDP.
  • The study provides valuable insights for selecting appropriate ML and feature engineering techniques for SDP.