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Updated: Jul 31, 2025

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
Surface figure measurement tool based on a radial shearing interferometer using a geometric phase lens with various
This study introduces a compact radial shearing interferometer using a geometric phase lens for precise surface figure measurement. The innovative system enables rapid reconstruction of optical component surface figures with high accuracy over an extended area.
Area of Science:
- Optical Engineering
- Metrology
- Nanotechnology
Background:
- Surface figure measurement is critical for optical component performance.
- Traditional interferometers can be complex and limited in field of view.
- Geometric phase lenses offer unique polarization and diffraction properties.
Purpose of the Study:
- To develop a compact and efficient radial shearing interferometer for surface figure measurement.
- To leverage geometric phase lens characteristics for wavefront generation and analysis.
- To enable rapid and accurate reconstruction of optical component surface figures.
Main Methods:
- Utilizing a geometric phase lens to generate two radially sheared wavefronts.
- Employing a polarization pixelated complementary metal-oxide semiconductor camera to capture four phase-shifted interferograms.
- Adjusting the incident wavefront to match the target shape for planar reflected wavefronts.
- Reconstructing the surface figure from radial wavefront slope calculations.
Main Results:
- Successfully reconstructed surface figures of various optical components.
- Achieved measurement deviations of less than 0.78 µm over an extended measurement area.
- Demonstrated a fixed radial shearing ratio independent of the measured surface figures.
- Instantaneous reconstruction of the whole surface figure was enabled.
Conclusions:
- The compact radial shearing interferometer based on a geometric phase lens is a viable tool for precise surface figure measurement.
- The system offers advantages in speed, accuracy, and extended measurement capability.
- The method provides a robust approach for optical metrology applications.
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