Quantifying the Mechanical Properties of Yeast Candida albicans Using Atomic Force Microscopy-based Force...

Area of Science:

• Mycology
• Biophysics
• Microbiology

Background:

• Fungi exhibit remarkable adaptability to diverse environmental stresses through genomic plasticity and morphological variations.
• Mechanical stimuli, including osmotic pressure changes and surface remodeling, influence fungal physiology via complex signaling networks.
• Understanding the biophysical properties at the host-fungal interface is crucial for deciphering fungal pathogenesis.

Purpose of the Study:

• To introduce a label-free, high-resolution atomic force microscopy (AFM) method.
• To provide a step-by-step protocol for measuring the physical properties of the human fungal pathogen Candida albicans.
• To facilitate quantitative studies of fungal biophysics at the host-pathogen interface.

Main Methods:

• Utilized atomic force microscopy (AFM) for label-free, high-resolution measurements.
• Developed a detailed protocol for assessing physical properties of fungal cells.
• Applied microscopy-based techniques to monitor dynamic mechanics on the fungal cell surface.

Main Results:

• Successfully measured the physical properties of Candida albicans using AFM.
• Demonstrated the capability of the method to observe fungal cell surface dynamics.
• Established a quantitative approach to study host-fungal interactions.

Conclusions:

• The described AFM method offers a valuable tool for investigating fungal biophysical properties.
• This technique can enhance our understanding of how fungi respond to host stresses and antifungal treatments.
• Quantitative biophysical analysis is essential for understanding fungal disease development.