The Electrical Double Layer
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Yuxin Lei1, Qiaoling Lin2,3, Sanshui Xiao2,3
1State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics, Sun Yat-Sen University, Guangzhou 510275, China.
Defects in few-layer molybdenum ditelluride (MoTe2) enable light emission at telecommunication O-band wavelengths, overcoming cryogenic temperature limitations for optoelectronic applications.
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