Imaging ferroelectric domains with a single-spin scanning quantum sensor

The ability to sensitively image electric fields is important for understanding many nanoelectronic phenomena, including charge accumulation at surfaces¹ and interfaces² and field distributions in active electronic devices³. A particularly exciting application is the visualization of domain patterns in ferroelectric and nanoferroic materials^4,5, owing to their potential in computing and data storage^6-8. Here, we use a scanning nitrogen-vacancy (NV) microscope, well known for its use in magnetometry⁹, to image domain patterns in piezoelectric (Pb[Zr_0.2Ti_0.8]O₃) and improper ferroelectric (YMnO₃) materials through their electric fields. Electric field detection is enabled by measuring the Stark shift of the NV spin^10,11 using a gradiometric detection scheme¹². Analysis of the electric field maps allows us to discriminate between different types of surface charge distributions, as well as to reconstruct maps of the three-dimensional electric field vector and charge density. The ability to measure both stray electric and magnetic fields^9,13 under ambient conditions opens opportunities for the study of multiferroic and multifunctional materials and devices^8,14.