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Updated: Jul 29, 2025

Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
Published on: December 3, 2013
GHz sample excitation at the ALBA-PEEM
Muhammad Waqas Khaliq1, José M Álvarez2, Antonio Camps2
1ALBA Synchrotron Light Facility, Carrer de la Llum, 2 - 26, Cerdanyola del Vallés, 08290 Barcelona, Spain; Department of Condensed Matter Physics, University of Barcelona, Barcelona, 08028 Spain.
Abstract:
We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.
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