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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jul 29, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Large-range high-speed dynamic-mode atomic force microscope imaging: adaptive tapping towards minimal force.

Jiarong Chen¹, Qingze Zou¹

¹Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ 08854, United States of America.

|May 19, 2023

Summary

This study introduces a novel software-hardware approach for high-speed atomic force microscope (AFM) imaging. The enhanced method achieves high-quality nanoscale imaging at over 100 Hz across large scan ranges, overcoming previous limitations.

Keywords:

atomic force microscope data driven high-speed AFM imaging iterative learning control

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Area of Science:

Materials Science
Nanotechnology
Instrumentation

Background:

High-speed atomic force microscope (AFM) imaging is crucial for observing dynamic nanoscale processes like polymer crystallization.
Existing tapping-mode AFM faces challenges in achieving high speeds due to nonlinear probe-sample interactions and limited hardware bandwidth.
Previous adaptive multiloop mode (AMLM) techniques improved speed but were constrained by hardware and processing limitations.

Purpose of the Study:

To develop and implement a software-hardware integrated approach for high-speed, large-range tapping-mode AFM imaging.
To enhance the adaptive multiloop mode (AMLM) technique for optimized probe tapping regulation.
To overcome limitations in hardware bandwidth and online signal processing for faster AFM imaging without compromising quality or scan range.

Main Methods:

Integration of an enhanced adaptive multiloop mode (AMLM) algorithm with a field-programmable gate array (FPGA) platform.
Optimization of probe tapping regulation for improved performance in tapping-mode AFM.
Experimental validation of the proposed software-hardware integrated system.

Main Results:

Achieved high-quality AFM imaging at scanning rates of 100 Hz and higher.
Demonstrated capability for large-range imaging over 20 micrometers.
Successfully increased imaging speed without sacrificing image quality or scan area.

Conclusions:

The proposed software-hardware integrated approach significantly enhances tapping-mode AFM imaging speed and range.
This advancement enables more efficient observation of dynamic nanoscale phenomena.
The optimized AMLM technique integrated with FPGA offers a robust solution for high-performance AFM applications.