Towards artefact-free AFM image presentation and interpretation

Atomic force microscopy (AFM) is based upon a simple operational principle. However, the presentation and interpretation of AFM images can easily suffer from consequential artefacts that are easily overlooked. Here we discuss results from AFM and its companion variations AFM-IR (AFM combined with infrared spectroscopy) and PF-QNM (an AFM mode called peak-force quantitative nano-mechanical mapping) by imaging 'bee' structures in asphalt binder (bitumen) as examples. We show how common problems manifest themselves and provide solutions, with the intent that authors can present their results clearly and avoid interpreting artefacts as true physical properties, thereby raising the quality of AFM research.