In Situ FTIR Spectroscopy for Scanning Accessible Active Sites in Defect-Engineered UiO-66
Vera V Butova1,2, Videlina R Zdravkova1, Olga A Burachevskaia2
1Institute of General and Inorganic Chemistry, Bulgarian Academy of Sciences, 1113 Sofia, Bulgaria.
Nanomaterials (Basel, Switzerland)
|May 27, 2023
Summary
Defect engineering in UiO-66 metal-organic frameworks using benzoic acid modulates acid sites. Fourier-transform infrared (FTIR) spectroscopy reveals how these sites interact with adsorbates, crucial for catalysis.
Area of Science:
- Materials Science
- Catalysis
- Surface Chemistry
Background:
- UiO-66 is a highly stable metal-organic framework (MOF) with tunable properties.
- Defect engineering is a key strategy to modify MOF characteristics, including acidity.
- Understanding acid site behavior is vital for UiO-66 applications in adsorption and catalysis.
Purpose of the Study:
- To investigate the effect of defect engineering using benzoic acid on the acidic properties of UiO-66.
- To characterize the nature and availability of acid sites in modified UiO-66 samples.
- To assess the utility of FTIR spectroscopy in probing these acid sites.
Main Methods:
- Solvothermal synthesis of UiO-66 with benzoic acid as a modulator.
- Characterization using various techniques, including FTIR spectroscopy.
- Assessment of acidic properties via adsorption of CO and CD3CN probe molecules.
Main Results:
- Bridging μ3-OH groups were present in samples evacuated at room temperature.
- Dehydroxylation at 250 °C removed μ3-OH groups.
- Modulator-free synthesis yielded open Zr sites, while modulator-containing samples had benzoate-saturated sites.
- Dehydroxylation generated new bare Zr sites interacting with acetonitrile, not CO.
Conclusions:
- FTIR spectroscopy is effective for identifying and quantifying acid sites in UiO-66.
- Benzoate saturation in modulated UiO-66 hinders probe molecule interaction.
- Defect engineering significantly influences the type and accessibility of acid sites in UiO-66, impacting its performance.


