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Updated: Jul 28, 2025

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors

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SRAM-Based PUF Readouts.

Sergio Vinagrero¹, Honorio Martin², Alice de Bignicourt³

¹Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA, 38000, Grenoble, France. sergio.vinagrero-gutierrez@univ-grenoble-alpes.fr.

Scientific Data

|May 27, 2023

Summary

This summary is machine-generated.

This study introduces a new dataset for characterizing SRAM-based Physical Unclonable Functions (PUFs) on microcontrollers. The dataset aids in assessing PUF quality for hardware security applications.

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Area of Science:

Hardware Security
Embedded Systems Engineering
Integrated Circuit Design

Background:

Physical Unclonable Functions (PUFs) are crucial for hardware root of trust.
Large-scale characterization of PUFs is essential for industrial adoption but is time-consuming and costly.
Existing datasets for PUF characterization are limited, especially for microcontroller-based solutions.

Purpose of the Study:

To present a comprehensive dataset for SRAM-based PUFs on microcontrollers.
To facilitate the quality assessment and suitability evaluation of PUFs for hardware security.
To enable research into PUF aging and reliability properties.

Main Methods:

Collected SRAM readouts and internal sensor data (voltage, temperature) from 84 STM32 microcontrollers.
Developed a custom, open platform for automated data acquisition.
Designed the platform to support experiments on PUF aging and reliability.

Main Results:

A novel dataset comprising detailed SRAM readouts and environmental parameters for 84 microcontrollers.
The dataset enables large-scale parameter characterization of SRAM-based PUFs.
The data acquisition platform is validated for its efficiency and versatility.

Conclusions:

The presented dataset significantly reduces the effort required for PUF characterization.
This resource supports the development of robust hardware root of trust solutions.
The open platform fosters further research in PUF reliability and aging.