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We present calibrated microwave measurements for qubit sample holders at millikelvin temperatures. This method validates qubit packaging and wiring, minimizing state-preparation errors for quantum computing applications.

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Area of Science:

  • Quantum Computing
  • Cryogenic Engineering
  • Microwave Engineering

Background:

  • Accurate characterization of cryogenic components is crucial for quantum computing.
  • Previous work established one-port cryogenic calibration, necessitating extension to two-port measurements.

Purpose of the Study:

  • To report calibrated microwave transmission and reflection measurements of a qubit sample holder at millikelvin temperatures.
  • To extend cryogenic calibration methodology to two-port measurements using an unknown thru standard.
  • To assess the impact of component reflections on qubit state-preparation errors.

Main Methods:

  • Implemented a two-port Short-Open-Load-Thru (SOLT) calibration at millikelvin temperatures.
  • Performed calibrated microwave transmission and reflection measurements on a printed circuit board within the sample holder.
  • Characterized a cascade of cryogenic components including an attenuator, coaxial cable, and sample holder.

Main Results:

  • Achieved calibrated transmission and reflection measurements at millikelvin temperatures.
  • Determined return loss parameters for cryogenic components.
  • Calculated negligible state-preparation errors (5-7 GHz) due to reflections.

Conclusions:

  • Calibrated cryogenic scattering parameter measurements are effective for validating qubit packaging.
  • The presented methodology is essential for minimizing errors in quantum control lines.
  • This work facilitates the development of reliable quantum computing hardware.