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Updated: Jul 28, 2025

Synthesis and Operation of Fluorescent-core Microcavities for Refractometric Sensing
Published on: March 13, 2013
A correction for higher-order refraction in cathodoluminescence spectrometry
Michael Stöger-Pollach1, Keanu Zenz2, Felix Ursin2
1University Service Center for Transmission Electron Microscopy (USTEM), Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria.
Abstract:
Cathodoluminescence (CL) is a developing analytical method in electron microscopy, because of its excellent energy resolution. Usually a Czerny-Turner type spectrometer is employed, having a blazed grating as analyzer. Unlike a prism analyzer, where the dispersion depends on the refractive index of the prism itself leading to a non-linear spectral distribution, the grating has the advantage that the spectral distribution depends linearly on the wavelength. As a draw-back, higher-order refraction alters the measured optical spectrum at larger wavelengths. In general, blazed gratings are used in order to minimize this effect in a certain spectral range. Nevertheless, the higher-order intensities can be still significant. In the present study we present a method for correcting the acquired optical spectra with respect to higher order diffraction intensities and apply it to CaO and GaN CL-spectra.

