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Related Experiment Video

Updated: Jul 27, 2025

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

Neutral helium atom microscopy.

Adrià Salvador Palau¹, Sabrina Daniela Eder¹, Gianangelo Bracco²

¹Department of Physics and Technology, University of Bergen, Allegaten 55, Bergen, 5007, Norway.

Ultramicroscopy

|June 7, 2023

Summary

This summary is machine-generated.

Neutral helium atom microscopy (SHeM) offers unique surface imaging of delicate materials. This review details the technique

Keywords:

Helium atom scattering Microscopy Molecular beams NAM Neutral atom microscopy Neutral helium microscopy SHeM

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Last Updated: Jul 27, 2025

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

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Published on: October 9, 2012

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

Area of Science:

Surface science
Microscopy techniques
Nanotechnology

Background:

Neutral helium atom microscopy (SHeM) is a novel imaging technique.
It utilizes a neutral helium atom beam as a probe.
SHeM offers advantages like low energy, surface sensitivity, and high depth of field.

Purpose of the Study:

To review the research in neutral helium atom microscopy.
To detail the helium atom's path through the microscope.
To discuss experimental and theoretical challenges and recent advances.

Main Methods:

Review of existing research on SHeM.
Step-by-step analysis of helium atom trajectory: beam generation, atom optics, sample interaction, and detection.
Discussion of SHeM design and alternative atom/molecule imaging.

Main Results:

SHeM enables damage-free imaging of fragile and non-conducting samples.
It allows Ångström-scale inspection of 2D materials and nano-coatings.
Potential for nano stereo microscopy with true-to-scale 3D topography.

Conclusions:

SHeM is a promising technique with significant potential for materials science.
Further research is needed to fully exploit its capabilities.
Advances in SHeM design and alternative probes are expanding its applications.