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Updated: Jul 27, 2025

Author Spotlight: Non-Invasive Imaging of Complex Bio-Structures Using Polarization-Sensitive Two-Photon Microscopy
Published on: September 8, 2023
Baoliang Ge1,2, Qing Zhang1, Rui Zhang3
1Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States.
Polarized shearing interference microscopy (PSIM) enables quantitative measurement of molecular orientation dynamics in birefringent materials. This new method achieves high-speed imaging, overcoming previous limitations in dynamic material analysis.
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