Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Overview
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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Updated: Jul 26, 2025

Quantifying X-Ray Fluorescence Data Using MAPS
Published on: February 17, 2018
Matthew Ozon1, Konstantin Tumashevich1, Nønne L Prisle1
1Center for Atmospheric Research, PO BOX 4500, University of Oulu, Finland.
This study introduces a new method to estimate the alignment parameter in X-ray photoelectron spectroscopy (XPS) using raw spectral data. This advancement allows for more accurate quantitative analysis of XPS, improving material characterization.
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