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Related Experiment Video

Updated: Jul 18, 2025

Determining the Chemical Composition of Corrosion Inhibitor/Metal Interfaces with XPS: Minimizing Post Immersion Oxidation
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Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations

Matthew Ozon1, Konstantin Tumashevich1, Jack J Lin1

  • 1Center for Atmospheric Research, University of Oulu, PO Box 4500, Finland.

Journal of Synchrotron Radiation
|August 23, 2023
PubMed
Summary

PROPHESY reconstructs surface-depth profiles using X-ray photoelectron spectroscopy. This Bayesian inversion method enhances material analysis for various sample types, offering new insights into surface composition.

Keywords:
X-ray photoelectron spectroscopyacquisition modelatmospheric surfacesdepth profileinversion algorithm

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Last Updated: Jul 18, 2025

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Area of Science:

  • Surface science
  • Materials characterization
  • Spectroscopy

Background:

  • X-ray photoelectron spectroscopy (XPS) is crucial for surface analysis.
  • Reconstructing detailed surface-depth profiles from XPS data remains challenging.
  • Accurate depth profiling is essential for understanding material properties.

Purpose of the Study:

  • Introduce PROPHESY, a novel technique for surface-depth profile reconstruction.
  • Develop an inversion methodology applicable to diverse sample geometries.
  • Validate the technique's performance and identify potential limitations.

Main Methods:

  • Utilize a Bayesian framework and primal-dual convex optimization for data inversion.
  • Develop acquisition models for planar, cylindrical, and spherical sample geometries.
  • Employ simulated data for proof-of-concept testing and characterization.

Main Results:

  • Successfully reconstructed surface-depth profiles from simulated XPS data.
  • Demonstrated the applicability of the PROPHESY technique across different sample types.
  • Illustrated the impact of electron attenuation length uncertainty on results.

Conclusions:

  • PROPHESY offers a robust method for XPS depth profiling.
  • The technique is adaptable to various sample forms, including bulk, liquid microjets, and droplets.
  • Understanding uncertainties in electron attenuation length is key for accurate profile reconstruction.