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A Physics-Informed Automatic Neural Network Generation Framework for Emerging Device Modeling.

Guangxin Guo1, Hailong You1, Cong Li1

  • 1School of Microelectronics, Xidian University, Xi'an 710071, China.

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Summary
This summary is machine-generated.

This study introduces an Automatic Physical-Informed Neural Network (AutoPINN) framework to address challenges in semiconductor modeling. AutoPINN ensures accurate, physically consistent neural network models for devices, accelerating development.

Keywords:
automated machine learning (AutoML)circuit simulationcompact modelemergingdevice modelingfield-effect transistor (FET)neural networkphysical informedsemiconductor device

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Area of Science:

  • Semiconductor device modeling
  • Artificial intelligence in engineering
  • Computational physics

Background:

  • Traditional equation-based semiconductor modeling faces accuracy and time constraints.
  • Neural network (NN)-based models offer potential but suffer from unphysical behaviors and complex structure optimization.
  • Existing NN models lack smoothness and monotonicity, limiting practical application.

Purpose of the Study:

  • To propose an Automatic Physical-Informed Neural Network (AutoPINN) generation framework.
  • To resolve unphysical behaviors in NN-based compact models.
  • To automate the determination of optimal NN structures for semiconductor device simulation.

Main Methods:

  • Developed a framework combining Physics-Informed Neural Networks (PINNs) and a two-step Automatic Neural Network (AutoNN).
  • PINNs incorporate physical information to ensure model validity.
  • AutoNN automatically optimizes NN architecture without expert intervention.

Main Results:

  • The AutoPINN framework achieved less than 0.05% error on gate-all-around transistor devices.
  • Demonstrated preservation of smoothness in high-order derivatives and monotonicity.
  • Validated promising generalization capabilities through test error and loss landscape analysis.

Conclusions:

  • AutoPINN effectively resolves unphysical behaviors and automates NN structure selection.
  • The framework accelerates the development and simulation of emerging semiconductor devices.
  • This approach offers a robust and efficient alternative to traditional modeling methods.