Cong Li
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5CO-AUTHORS
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Publications (4)
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|Apr 27, 2024
Leakage and Thermal Reliability Optimization of Stacked Nanosheet Field-Effect Transistors with SiC Layers.Cong Li, Yali Shao, Fengyu Kuang
|Mar 28, 2024
Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect Transistors.Xiaoming Li, Yali Shao, Yunqi Wang
|Jan 23, 2024
Logical Resolving-Based Methodology for Efficient Reliability Analysis.Zhengguang Tang, Cong Li, Hailong You
|Jun 28, 2023
A Physics-Informed Automatic Neural Network Generation Framework for Emerging Device Modeling.Guangxin Guo, Hailong You, Cong Li
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