Particle size distribution measurement based on the angular scattering efficiency factor spectra inversion-simulation...

The quantification of the particle size distribution (PSD) within a particle system is significant to various domains, including atmospheric and environmental sciences, material science, civil engineering, and human health. The scattering spectrum reflects the PSD information of the particle system. Researchers have developed high-precision and high-resolution PSD measurements for monodisperse particle systems through scattering spectroscopy. However, for polydisperse particle systems, current methods based on light scattering spectrum and Fourier transform analysis can only obtain the information of the particle component, but cannot provide the relative content information of each component. In this paper, a PSD inversion method based on the angular scattering efficiency factors (ASEF) spectrum is proposed. By establishing a light energy coefficient distribution matrix, and then measuring the scattering spectrum of the particle system, PSD can be measured in conjunction with inversion algorithms. The simulations and experiments conducted in this paper substantiate the validity of the proposed method. Unlike the forward diffraction approach that measures the spatial distribution of scattered light I(θ) for inversion, our method uses the multi-wavelength distribution information of scattered light β(λ). Moreover, the influences of noise, scattering angle, wavelength, particle size range, and size discretization interval on PSD inversion are studied. The method of condition number analysis is proposed to identify the appropriate scattering angle, particle size measurement range, and size discretization interval, and it can reduce the root mean square error(RMSE) of PSD inversion. Furthermore, the method of wavelength sensitivity analysis is proposed to select the spectral band with higher sensitivity to particle size changes, thereby improving the computational speed and avoiding the problem of diminished accuracy caused by the reduction of the number of wavelengths used.