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Updated: Jul 25, 2025

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Identifying the role of carrier overflow and injection current efficiency in a GaN-based micro-LED efficiency droop

Yibo Liu, Mengyuan Zhanghu, Feng Feng

    Optics Express
    |June 29, 2023
    PubMed
    Summary

    This study reveals that injection current efficiency droop causes efficiency droop in green and blue Gallium Nitride (GaN)-based micro-light-emitting diodes (micro-LEDs). Green micro-LEDs show more severe droop due to greater carrier overflow.

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