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Pulsed-beam transmission electron microscopy and radiation damage

David J Flannigan1, Elisah J VandenBussche1

  • 1Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Avenue SE, Minneapolis, MN 55455, USA; Minnesota Institute for Ultrafast Science, University of Minnesota, Minneapolis, MN 55455, USA.

Micron (Oxford, England : 1993)
|June 30, 2023
PubMed
Summary

Pulsed electron beams in transmission electron microscopes (TEMs) can significantly reduce specimen damage during materials characterization. This review highlights evidence supporting pulsed-beam TEM as a viable method for mitigating beam-induced damage.

Keywords:
Beam damageBeam sensitiveCryo-TEMUltrafast

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