Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol.

Area of Science:

• Physics
• Particle Detection Technology

Background:

• Highly segmented double-sided silicon detectors are crucial for advanced particle detection systems.
• Optimizing their performance presents significant technological challenges due to their complexity.

Purpose of the Study:

• To propose a versatile test bench for characterizing silicon detectors with up to 256 electronic channels.
• To establish a quality control protocol ensuring detectors meet stringent performance requirements.
• To investigate the electrical and charge collection properties of a specific silicon detector.

Main Methods:

• Utilized off-the-shelf equipment to construct a 256-channel test bench.
• Performed detailed characterization including IV curve analysis, charge collection efficiency, and energy resolution measurements.
• Introduced the "energy triangle" methodology to analyze charge sharing and hit distribution.

Main Results:

• Determined key detector parameters: depletion voltage (110 V), bulk resistivity (9 kΩ·cm), and electronic noise (8 keV).
• Successfully visualized charge sharing effects between adjacent detector strips using the "energy triangle" method.
• Established an interstrip-to-strip hit ratio (ISR) for hit distribution studies.

Conclusions:

• The developed test bench and protocol effectively ensure the quality of highly segmented silicon detectors.
• The "energy triangle" provides a novel visualization tool for understanding charge sharing phenomena.
• This work contributes to the advancement of state-of-the-art particle detection systems.