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Backdoor Attack on Deep Neural Networks Triggered by Fault Injection Attack on Image Sensor Interface.

Tatsuya Oyama1, Shunsuke Okura2, Kota Yoshida2

  • 1Graduate School of Science and Engineering, Ritsumeikan University, 1-1-1 Noji-higashi, Kusatsu 525-8577, Shiga, Japan.

Sensors (Basel, Switzerland)
|July 11, 2023
PubMed
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This study introduces a novel method for backdoor attacks on deep neural networks (DNNs) using fault injection on mobile industry processor interfaces (MIPI). This technique enhances adversarial mark generation for more stable and successful DNN backdoor attacks.

Area of Science:

  • Computer Science
  • Cybersecurity
  • Artificial Intelligence

Background:

  • Backdoor attacks induce deep neural network (DNN) misclassification using adversarial marks.
  • Conventional methods for creating adversarial marks are unstable due to variations in shooting environments.

Purpose of the Study:

  • To propose a stable method for generating adversarial marks for backdoor attacks.
  • To investigate the effectiveness of fault injection on the mobile industry processor interface (MIPI) for backdoor attacks.

Main Methods:

  • Developed an image tampering model to generate adversarial marks via fault injection on the MIPI.
  • Trained a backdoor model using poison data images generated by the simulation model.
  • Conducted backdoor attack experiments on a trained DNN model.
Keywords:
backdoor attackfault injection attackimage sensor interfacemobile industry processor interface (MIPI)

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Main Results:

  • The backdoor model achieved 91% clean data accuracy in normal operation.
  • The fault injection backdoor attack achieved an 83% success rate.
  • The proposed method demonstrated a stable and effective approach to backdoor attacks.

Conclusions:

  • Fault injection on MIPI provides a stable and effective method for generating adversarial marks.
  • This technique significantly enhances the success rate of backdoor attacks on DNNs.
  • The findings highlight vulnerabilities in DNNs related to image sensor interfaces.