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Validation of High-Availability Model for Edge Devices and IIoT.

Peter Peniak¹, Emília Bubeníková¹, Alžbeta Kanáliková¹

¹Department of Control and Information Systems, Faculty of Electrical Engineering and Information Technology, University of Zilina, 010 26 Zilina, Slovakia.

Sensors (Basel, Switzerland)

|July 11, 2023

Summary

This study introduces an enhanced Edge device model with redundancy for high availability in industrial settings. The model ensures rapid recovery and 100% data redundancy, crucial for critical manufacturing processes.

Keywords:

Edge Edge device IIOT MQTT protocol OPC UA protocol high availability model industry model

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Area of Science:

Industrial IoT and Edge Computing
System Reliability and High Availability

Background:

Industrial competitiveness hinges on smooth, high-quality operations, where system failures have severe economic and safety consequences.
Real-time applications demand minimized data processing latency, driving the adoption of Cloud/Fog and Edge computing.
Existing Edge solutions often lack the high availability and reliability crucial for industrial environments, risking application failure and process disruption.

Purpose of the Study:

To develop and validate an enhanced Edge device model incorporating redundancy for high availability in industrial applications.
To integrate various sensors and ensure data synchronization for cloud-based decision-making.
To provide a robust Edge computing solution that minimizes downtime and ensures rapid system recovery.

Main Methods:

Designed an Edge device model utilizing redundancy through mirroring or duplexing with a secondary device.
Implemented data recording, synchronization, and availability for sensor data using Edge computing.
Supported OPC UA and MQTT protocols for Edge device communication and implemented models in Node-Red software for testing and validation.

Main Results:

Validated a high-availability Edge device model achieving 100% redundancy and rapid recovery times.
Demonstrated the effectiveness of Edge mirroring for critical applications requiring fast recovery without adjustments.
Confirmed the model's capability to address critical cases where Edge device malfunction could impact manufacturing processes.

Conclusions:

The proposed enhanced Edge device model significantly improves industrial system reliability and availability through built-in redundancy.
Edge mirroring offers a robust solution for high-availability needs in critical manufacturing, ensuring minimal disruption.
Further enhancements using Edge duplexing can extend the maturity of Edge high availability for advanced process control.