Validation of High-Availability Model for Edge Devices and IIoT

Peter Peniak1, Emília Bubeníková1, Alžbeta Kanáliková1

  • 1Department of Control and Information Systems, Faculty of Electrical Engineering and Information Technology, University of Zilina, 010 26 Zilina, Slovakia.

PubMed
Summary

This study introduces an enhanced Edge device model with redundancy for high availability in industrial settings. The model ensures rapid recovery and 100% data redundancy, crucial for critical manufacturing processes.

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